발행물
컨퍼런스
제23회 한국반도체학술대회
2016
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Experimental Demonstration of Sub-60-mV/decade Steep Switching FinFET using Negative Capacitance Effects
International Conference on Engineering and Applied Science
2015
Accurate Extraction of the Physical Distance between Two Interface States Causing Variable Junction Leakage
2015 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices (AWAD)
Impact of Trap Position on Random Telegraph Noise in a 70A Nanowire Field-Effect Transistor
Design Optimization for Process-Variation-Tolerent 22-nm FinFET-Based 6T-SRAM Cell with Worst-Case Sampling Method
Field Enhanced High-k Layer to Improve the Performance of Germanium-Source Vertical Tunnel Field-Effect Transistor