발행물
컨퍼런스
제22회 한국반도체학술대회
2015
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Investigation of Work-Function Variation for Germanium-Source Tunnel Field-Effect Transistor
Heterojunction Symmetric Tunnel Field-Effect Transistor (S-TFET)
A Novel Sampling Method Using Confidence Ellipse Concept to Estimate the Impact of Random Variation on Static Random Access Memory (SRAM)
Effect of Double Patterning on Performance Variation Induced by Gate Line-Edge-Roughness (LER) in Germanium FinFET
A Newly-Proposed Vacuum-Channel Transistor