Tri-gate bulk MOSFET design for CMOS scaling to the end of the roadmap

Study of a hysteresis window of FinFET and fully-depleted silicon-on-insulator (FDSOI) MOSFET with ferroelectric capacitor

Tapered Coating for Nano-electro-mechanical (NEM) Relay to Improve Energy-delay Product

Comparative Study of Negative Differential Capacitance in Ferroelectric Capacitors: P(VDF0.75-TrFE0.25) and P(VDF0.50-TrFE0.50)

Comparative Study of Negative Capacitance in Ferroelectric Capacitors: P(VDF0.75-TrFE0.25) Versus Pb(Zr, Ti)O3

Atomic Layer Deposition of TiO2 using Titanium Isopropoxide and H2O: Operational Principle of Equipment and Parameter Setting

Impact of Trap Position on Random Telegraph Noise in a 70-angstrom Nanowire eld-Effect Transistor

Worst case sampling method with confidence ellipse for estimating the impact of random variation on static random access memory (SRAM)

Highly scalable NAND flash memory cell design embracing backside charge storage

Performance and Variation-Immunity Benefits of Segmented-Channel MOSFETs (SegFETs) Using HfO2 or SiO2 Trench Isolation