발행물
컨퍼런스
IEEE VLSI Testing Symposium
2008
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Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits
2007
Transformer-Coupled Loopback Test for Differential Mixed-Signal Specifications
IEEE European Test Symposium
2006
Optimized Signature-Based Statistical Alternate Test for Mixed-Signal Performance Parameters
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits
IEEE International Mixed-Signals TestingWorkshop
2005
Predicting Mixed-Signal Specifications with Improved Accuracy Using Optimized Signatures