발행물
컨퍼런스
The 16th Korea Test Conference
2015
,
Analog Performance-based Self-Test Approaches for Mixed-Signal Circuits
IEEE VLSI Testing Symposium (VTS)
2008
Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits
2007
Transformer-Coupled Loopback Test for Differential Mixed-Signal Specifications
IEEE European Test Symposium (ETS)
2006
Optimized Signature-Based Statistical Alternate Test for Mixed-Signal Performance Parameters
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits