발행물
컨퍼런스
International Symposium for the 50th anniversary of the Korean Ceramic Society
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Analysis of Resistive Switching Characteristics in TiO2 Thin Film by Conductive Atomic Force Microscopy
Combined atomic-layer- and chemical-vapor-deposition, and selective growth of Ge2Sb2Te5 films on TiN/W contact plug
The 14th International Workshop on Oxide Electronics
Bipolar resistance switching of Pt/TiO2/Ptstructure
A study on the resistive unipolar switching behavior of TiO2 thin films using conductive atomic force microscopy
ISIF 2007
Space charge limited conduction and localized filament switching mechanism in resistive switching of TiO2 thin films