발행물
컨퍼런스
ISIF 2007
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Investigation of the resistance switching phenomena in the Ge0.5Te0.5 thin films with contact area variation
The 4th International Workshop on Nanoscale Semiconductor Devices
Investigation of the resitance switching phenomena tin the Ge0.5Te0.5 thin films with contact area variation
제 14회 한국반도체학술대회
Analysis of Resistive Switching of TiO2 focused on Current Compliance Using Conductive Atomic Force Microscopy
The Electrochemical Society 210th meeting
Resistive Switching in Pt/Al2O3/TiO2/Ru Stacked Structures
The 6th Japan-Korea Conference on Ferroelectrics
Analysis of Resistive Switching of TiO2 using Conductive Atomic Force Microscopy