,

Contrastive CNN for Mixed-type Pattern Recognition with Single-type Pattern on Wafer Bin Maps

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Latent Mapping Adversarial Networks in Manufacturing Defect Synthesis？

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Improved Anomaly Scoring for Anomaly Detection Using Auto Encoder based Unsupervised Learning from Unlabeled Data

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Time Series Fault Detection and Diagnosis Using A Two-Stage Attention-Based Recurrent Neural Network in Copper Refining Manufacturing

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Masked-CNN: CNN-based Class Probability Correction using Mask Image