Investigation of Work Function Variation Induced by Metal Gate and Process Variation Effect in 3D Stacked Nanowire FET Devices

The Extraction and Analysis of Parasitic Resistance of Nanowire-FET

Optimum Source/Drain Concentration of Nanowire FET Considering Parasitic Resistances and Capacitances

Comparison for Performance and Reliability Between Nanowire FET and FinFET versus Technology Node

Analysis of Current-Boosting Using Trenched Source/Drain in Single and Stacked Nanowire FET

Line Edge Roughness and Process Variation Effect of Three Stacked Gate-All-Around Silicon MOSFET Devices

Characteristics According to Parameters of Line Edge Roughness in Ultra-Scaled Gate-All-Around Nanowire FET

Investigation and analysis of dual-k spacer with different materials and spacer lengths for nanowire-FET performance

Analysis and optimization of RC delay in vertical nanoplate FET

Natural Local Self-Boosting Effect in 3D NAND Flash Memory