Assessing the Degree of Unsteadiness in Flow Modeling: From Physics to Numerical Solution
Bryan Karney, Byung Jun Jung, A. Alkozai
2008
2222
원자현미경(AFM)을 이용한 환경오염물질에 노출된 HeLa세포의 표면변화 연구
이수일, 최진희, 이시원
환경독성학회지, 2008
2223
Nanoscale surface property estimation using proper orthogonal decomposition in atomic force microscopy
Soo Il Lee, Seokyeon Hong, J.M. Lee
CIRP Annals, 2008
2224
Room-temperature tensile creep of a PZT wafer in short and open-circuit conditions
이수일, 이창환, 김상주
JOURNAL OF THE CERAMIC SOCIETY OF JAPAN, 2008
2225
The effect of fentanyl pretreatment on myoclonus during induction of anesthesia with etomidate in elderly patients
Ji Hyeon Lee, Jong Hwan Lee, Young Jhoon Chin, Soo Il Lee, Chan Jong Chung, Seung Cheol Lee, So Ron Choi
Korean Journal of Anesthesiology, 2008
2226
Feasibility study to design a particle deposition unit utilizing electrophoresis for off-line measurements
김정현
KOREAN JOURNAL OF CHEMICAL ENGINEERING, 2008
2227
Erratum: ""Recent Advance in Protection Technology for Extreme Ultraviolet Lithography Masks under Low-pressure Condition"" [J. Vac. Sci. Technol. B 26, L1(2008)]
김정현
Journal of Vacuum Science and Technology B, 2008
2228
Classification of highly monodisperse nanoparticles of NIST-traceable sizes by TDMA and control of deposition spot size on a surface by electrophoresis
김정현, 육세진, Heinz Fissan, Thomas Engelke, Christof Asbach, Till van der Zwaag, Jing Wang, David Y.H. Pui
JOURNAL OF AEROSOL SCIENCE, 2008
2229
Controlled deposition of SiO2 nanoparticles of NIST-traceable particle sizes for mask surface inspection system characterization
김정현, Se-Jin Yook, Heinz Fissan, Thomas Engelke, Christof Asbach, Till van der Zwaag, Florence Eshbach, Jing Wang, David Y. H. Pui
IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 2008
2230
Recent advance in protection technology for extreme ultraviolet lithography masks under low-pressure condition
김정현
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2008