Multiple machine learning approach to characterize two-dimensional nanoelectronic devices via featurization of charge fluctuation
Lee, K (Lee, Kookjin), Nam, S (Nam, Sangjin), Ji, H (Ji, Hyunjin), Choi, J (Choi, Junhee), Jin, JE (Jin, Jun-Eon), Kim, Y (Kim, Yeonsu), Na, J (Na, Junhong), Ryu, MY (Ryu, Min-Yeul), Cho, YH (Cho, Young-Hoon), Lee, H (Lee, Hyebin), Lee, J (Lee, Jaewoo), Joo, MK (Joo, Min-Kyu), Kim, GT (Kim, Gyu-Tae)...More.
NPJ 2D MATERIALS AND APPLICATIONS, 202101