발행물
컨퍼런스
Digest of Technical Papers - Symposium on VLSI Technology 2008
2008
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Fully integrated and functioned 44nm DRAM technology for 1GB DRAM
the 2007 IEEE International Reliability Physics Symposium Proceedings.
2007
Reliability Studies on Non Planar DRAM Cell Transistor
2006 Symposium on VLSI Technology
2006
Highly Scalable Saddle-Fin(S-Fin) transistor for sub-50nm DRAM technology
International Electron Devices Meeting (IEDM)
2002
Novel shallow trench isolation process using flowable oxide CVD for sub-100 nm DRAM
International Conference on VLSI and CAD
1999
HOSP(R) as a low dielectric material: comparative study against hydrogen silsesquioxane