발행물
컨퍼런스
Solid-State Device Research Conference (ESSDERC), 2016 46th European
2016
,
Comparison of hafnia and PZT based ferroelectrics for future non-volatile FRAM applications
ECS Transactions
2009
The effect of periodic relaxation on the growth behavior and electrical properties of atomic layer deposited PbTiO3 thin film
The effects of oxidants on the growth behavior of PbTiO3 thin film by Atomic layer deposition
IEEE EDTM
2025.03
A Perspective on Low Voltage Operating Ferroelectric Random-Access Memories Based on Ferroelectric (Hf,Zr)O2
KISM 2024
2024.11
Correlation between Device Physics and Material Chemistry in (Hf,Zr)O2-Based Ferroelectric Memories