발행물
컨퍼런스
나노코리아
2021
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Conventional/large-scale operation metrics to do comprehensive analysis on 8T-SRAM bit cells
나노코리아2021
Experimental verification on charge-boosting effect in metal-ferroelectric-metal capacitor
Effects of Rapid Thermal Annealing on Pt/Ag/HfO2/Pt Threshold Switching Device
한국반도체학술대회 2021
Experimental study of boosting effect in metal-ferroelectric-metal capacitor
A new approach to estimate the process-induced random variation in current-voltage characteristic of FinFET: Machine-Learning Technique