발행물
컨퍼런스
한국반도체학술대회
2020
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Energy-Delay Sensitivity Analysis of NEM Relay Using Negative Capacitance
FBFET-based Ring Oscillators for Neuromorphic Computing
Regression Model for investigating the impact of line-edge-roughness (LER)
Machine-Learning model for predicting the effect of line edge roughness on device performance
Observation of negative capacitance effect by phase field simulation