발행물
컨퍼런스
대한전자공학회 하계종합학술대회
2020
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Bayesian Linear Regression Method for Predicting the Impact of Line Edge Roughness in FinFET
A Study on the Bayesian Linear Regression Method in Evaluating the Immunity to Line Edge Roughness in FinFET
Line-Edge-Roughness (LER)에 의한 5nm FinFET의 문턱전압 변화 예측을 위한 인공신경망 모델
Nanowire FET와 Nanosheet FET에서의 process-induced random variation 비교 및 분석
A study of interface traps of Zr-doped HfO2 thin film in Metal-Insulator-Semiconductor (MIS) structure