발행물
컨퍼런스
Proc. of IEEE International Test Conference
2009
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Test Point Insertion Using Functional Flip-Flops to Drive Control Points
An Industrial Case Study of X-Canceling MISR
Proc. of IEEE Symposium on Defect and Fault Tolerance
Reducing Test Point Area for BIST through Greater Use of Functional Flip-Flops to Drive Control Points
Proc. of IEEE VLSI Test Symposium
Automated Selection of Signals to Observer for Efficient Silicon Debug
2008
Enhancing Silicon Debug via Periodic Monitoring