발행물
컨퍼런스
Proc. of International Conference on Simulation of Semiconductor Processes and Devices
2014
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New Perspective on Lifetime Prediction Approach for BTI and HCI Stressed Device and Its Impact on Circuit Lifetime
IEEE Symposium on Security and Privacy (Poster)
Power Replay Attack in Electronic Door Locks
Proc. of IEEE VLSI Test Symposium
2013
Enhanced Algorithm of Combining Trace and Scan Signals in Post-Silicon Validation
Proc. of IEEE International Conference on VLSI Design
Dynamic Trace Signal Selection for Post-Silicon Validation
Proc. of IEEE Symposium on Defect and Fault Tolerance
2011
Efficient Function Mapping in Nanoscale Crossbar Architecture