발행물
컨퍼런스
Proc. of ACM/IEEE Design, Automation & Test in Europe (DATE)
2020
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Reliable and Lightweight PUF-based Key Generation using Various Index Voting Architecture
ACM/IEEE International Conference On Computer Aided Design (ICCAD)
2019
Flipcy: Efficient Pattern Redistribution for Enhancing MLC PCM Reliability and Storage Density
International Conference on Compilers, Architecture, and Synthesis for Embedded Systems (CASES)
WiP : Computation offloading of acoustic model for client-edge-based speech recognition
Proc. of ACM/IEEE Design Automation Conference (DAC)
DRIS-3: Deep Neural Network Reliability Improvement Scheme in 3D Die-Stacked Memory based on Fault Analysis
MRLoc: Mitigating Row-hammering based on memory Locality