발행물
컨퍼런스
ACM/IEEE Design Automation Conference (DAC), Work-In-Progress Session
2017
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Observability Probability of Timing Critical Path Aware On-Chip Performance Monitoring Methodology
Proc. of IEEE International Symposium on Circuits and Systems (ISCAS)
Non-linear Library Characterization Method for FinFET Logic Cells by L1-minimization
Proc. of IEEE International Conference on Computer Communications (INFOCOM)
PUFSec: Device Fingerprint-based Security Architecture for Internet of Things
Proc. of ACM/IEEE Design, Automation & Test in Europe (DATE)
MVP ECC : Manufacturing process Variation aware unequal Protection ECC for memory reliability
Proc. of ACM/IEEE Design Automation Conference (DAC)
2016
Reducing Output Response Compaction Overhead by Exploiting X-Value Correlation