발행물
컨퍼런스
PRESM 2023
2023
,
High-resolution Optical Sectioning Structured Illumination Microscopy
Multiplexed Optical Spectrometer with High Resolution in the Wide Spectral Range
euspen’s 23rd International Conference
Rapid step height measurements by polarized dual low coherence scanning interferometry
Optica Design and Fabrication Congress 2023
Interferometric Metrology using Geometric Phases
Snapshot Roughness Measurement Method Using Polarization Lateral Shearing Interferometry