Polarized imaging interpreter for simultaneous clocking metrology of multiple objects

Single-shot spectrally resolved interferometry for the simultaneous measurement of the thickness and surface profile of multilayer films

Vision chromatic confocal sensor based on a geometrical phase lens

Motionless Polarizing Structured Illumination Microscopy

Subaperture stitching wavelength scanning interferometry for 3D surface measurement of complex-shaped optics

Spectrally resolved polarizing interferometer for single-shot line profiling

Diverging cyclic radial shearing interferometry for single-shot wavefront sensing

Advances in optical metrology and instrumentation: introduction

A compact high-precision periodic-error-free heterodyne interferometer

Single-shot freeform surface profiler