발행물
컨퍼런스
ThinFilms2008 and NanoMan2008
,
Electrical and reliability characteristics of MONOS memory with blocking oxide formed by radical oxidation process
The 6th Asian Meeting on Ferroelectrics
The structural and electrical analysis of LiCo3 doped (Ba,Sr)TiO3 and ZnBo doped (Ba,Sr)TiO3 ceramics for Low temperature sintering applications
Influence of plasma-etch damage on the interface states in silicon-on-insulator (SOI) structures investigated by capacitance-voltage (C-V) measurement
Prof. Int. Conf. on Cond. Monitoring and Diagnosis
Failure mechanism of Pb(Mg,Nb)O3-Pb(Zr,Ti)O3 Multilayer Ceramic Actuators
IEEE
Si NW field effect transistor test structures fabricated by top-down approaches (Invited)