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Transport Properties of Silicon Nanowire Field Effect Transistor Test Structures Fabricated by Top-Down Approaches

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Silicon nanowire field-effect transistors with Schottky barrier source/drain contacts by top-down approach

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Reverse Short Channel Effects in High-k Gated MOSFETs

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Ferroelectric thin films on Silicon Carbide for Next Generation Nonvolatile Memory and Sensor Devices [Invited]

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Characteristics of PZT/Al2O3 stack on SiC demonstrated in a NVFET