발행물
컨퍼런스
2012 IEEE Electrical Design of Advanced Package & Systems Symposium
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Noise Coupling Analysis between TSV and Active Circuit
Contactless Wafer-Level TSV Connectivity Testing Method Using Magnetic Coupling
Disconnection failure model and analysis of TSV-based 3D ICs
Optimized Inverter Design of Ring Oscillator based Wafer-Level TSV Connectivity Test (RO-TSV-CT)
14th Electronics Packaging Technology Conference (EPTC)
Design and Implementation of Magnetically Coupled Current Probe for Monitoring Simultaneous Switching current in Package