Through Silicon Via (TSV) Defect Modeling, Measurement, and Analysis
Bae, HC [Bae, Hyun-Cheol], Jung, DH[Jung, Daniel Hyunsuk], Kim, Y[Kim, Youngwoo], Kim, JJ[Kim, Jonghoon J.], Kim, H [Kim, Heegon], Choi, S[Choi, Sumin], Song, YH [Song, Yoon-Ho], Choi, KS [Choi, Kwang-Seong], Piersanti, S [Piersanti, Stefa, de Paulis, F [de Paulis, Franc, Orlandi, A [Orlandi, Antonio], Kim, Joungho
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 201701