Dose Measurements and Effects in DRAMs During PCB Inspections Using X-rays

Total-Ionizing Dose Damage from X-Ray PCB Inspection Systems

Write Recovery Time Degradation by Thermal Neutrons in DDR4 DRAM Components

DDR4 Ball Grid Array Package Intermittent Fracture Effect on Signal Integrity

Temperature Estimation of HBM2 Channels with Tail Distribution of Retention Errors in FPGA-HBM2 Platform

Divulge of Root Cause Failure in Individual Cells of 2x nm Technology DDR4 DRAM at Operating Temperature

Estimation of the Trap Energy Characteristics of Row Hammer-Affected Cells in Gamma-Irradiated DDR4 DRAM

Exploitations of Multiple Rows Hammering and Retention Time Interactions in DRAM Using X-Ray Radiation

Fault Coverage Re-Evaluation of Memory Test Algorithms With Physical Memory Characteristics

DDR4 BER Degradation Due to Crack in FBGA Package Solder Ball