발행물
컨퍼런스
International Test Conference
2016
,
HBM Memory Fault Grading and Results
WRTLT'14(The Fifteenth Workshop on RTL and High Level Testing)
2014
Test Correlation at Chip Level & System Level
Single Event Effects(SEE) Symposium and Military and Aerospace Programmable Logic Devices(MAPLD) Workshop
Voltage Dependence of Single Event Error Rates for Flip-Flops in Advanced Technologies - from Nominal to Near Threshold
Impact of Well Ties on Single Event Transient Width
반도체 기술 및 산업 동향 콜로키움 [반도체 package, test 기술 및 산업 전망]
2013
반도체 테스트 동향 및 이슈