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IEEE International Reliability Physics Symposium (IRPS)
2024
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Total-Ionizing Dose Damage from X-Ray PCB Inspection Systems
2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)
2017
BPPT-Bulk Potential Protection Technique for Hardened Sequentials
SELSE 13 Workshop - Silicon Errors in Logic - System Effects
Soft Error Hardened Flip-Flop Based on a Novel Bulk Potential Management Technique
IEEE International Test Conference(ITC)
2016
HBM Memory Fault Grading and Results
IEEE International Reliability Workshop
2014
Active-Precharge Hammering on a Row Induced Failure in DDR3 SDRAMs under 3x nm Technology