발행물
컨퍼런스
IEEE International Integrated Reliability Workshop (IIRW)
2010
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Vertically Partitioned SRAM-based Ternary Content Addressable Memory
International Symposium on Quality Electronic Design (ISQED)
2011
Design Method of NOR-Type Comparison Circuit in CAM with Ground Bounce Noise Considerations
IEEE International Conference on Intelligence and Information Technology (ICIIT 2010)
New DRAM HCI Qualification Method Emphasizing on Repeated Memory Access
Radiation and its Effects on Components and Systems (RADECS)
2009
Selection of the Optimal Interleaving Distance for Memories Suffering MCUs
SELSE 5 Workshop - Silicon Errors in Logic - System Effects
Analysis of a Multiple Cell Upset Failure Model for Memories