발행물
컨퍼런스
Single Event Effects(SEE) Symposium and Military and Aerospace Programmable Logic Devices(MAPLD) Workshop
2014
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Voltage Dependence of Single Event Error Rates for Flip-Flops in Advanced Technologies - from Nominal to Near Threshold
International school on the Effects on Radiation on Embedded Systems for Space Applications (SERESSA)
2012
MCU Effects on SER Modeling with Memory Architecture Parameters
SERESSA
Effects on Radiation on Embedded Systems for Space Applications
SEMICON China 2012
Why Memory Test Is Still a Challenge?
IEEE Santa Clara Valley CPMT Society Chapter Workshop
High-Energy Alpha Particle SEU Measurements for Flip Chip Devices