발행물
컨퍼런스
SERESSA 2012
2012
,
MCU Effects on SER Modeling with Memory Architecture Parameters
IEEE Santa Clara Valley CPMT Society Chapter Workshop
High-Energy Alpha Particle SEU Measurements for Flip Chip Devices
SEMICON China 2012
Why Memory Test Is Still a Challenge?
IEEE International Conference on Intelligence and Information Technology
2010
Vertically Partitioned SRAM-based Ternary Content Addressable Memory
IEEE International Integrated Reliability Workshop
SRAM Cell Reliability Degradations due to Cell Crosstalk