발행물
컨퍼런스
The 21st Asian Test Symposium (ATS'12)
2012
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Soft Error Issues with Scaling Technologies
Proc. of the conference on Radiation and its Effects on Components and Systems (RADECS)
Optimizing the Protection of Narrow Values in Memories Protected with Hamming Codes
Physical and Failure Analysis of Integrated Circuits (IPFA)
2011
DRAM Failure Cases Under Hot-Carrier Injection
Design Automation Conference (DAC)
Designing Ad-Hoc Scrubbing Sequences to Improve Memory Reliability against Soft Errors
Reliability Physics Symposium (IRPS)
AC-DC Factor Sensitivity for DRAM Components Lifetime under Hot-Carrier Injection