2018

,

Novel in-situ electrical characterization of the atomic layer deposition process on 2D transition metal dichalcogenides transistors

2017

,

Low temperature (400°C) ferroelectric Hf0.5Zr0.5O2 capacitors for next-generation FRAM applications

2002

,

The effect of H2O vs. O3 as the ALD oxidant on the ferroelectric phase transition of hafnium-zirconium oxide

2002

,

Repair techniques for indium-gallium-zinc-oxide thin-film transistors: a comparison between vacuum and solution processes

2004

,

Simple method for low-temperature processed In-Ga-Zn-O thin-film transistors by vertical diffusion technique