발행물
컨퍼런스
International Conference on Electronics, Information and Communication
2012.02
,
Investigation of Poly Depletion Effect in 3D stacked NAND flash memory
Variation of Threshold Voltage and ON Current Caused by Gate Length and Nanowire Diameter Fluctuation in Junctionless 3D NAND Flash Memory
Hong-Ik Univ.
2012
Analysis of organic electronic devices through simulation
Seoul National Univ.
Device simulation in organic electronics
Materials Research Society Fall Meeting
Blends of various molecular weights to control leakeage current in organic thin-film transistors