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전체 논문

167

11

Parylene-C-based flexible organic thin-film transistors and their reliability improvement using SU-8 passivation
Ah-Hyun Hong, Yu Jung Park, Jung-Hwa Seo, Yoon Kim*, Dong-Wook Park*
JVSTB, 2024

12

Long‐and Short‐Term Memory Characteristics Controlled by Electrical and Optical Stimulations in InZnO‐Based Synaptic Device for Reservoir Computing
Hyogeun Park, Dongyeol Ju, Chandreswar Mahata, Andrey Emelyanov, Minsuk Koo*, Sungjun Kim*
Advanced Electronic Materials, 2024

13

Current-Voltage Modeling of DRAM Cell Transistor Using Genetic Algorithm and Deep Learning
Jun Hui Park, Jung Nam Kim, Seonhaeng Lee, Gang-Jun Kim, Namhyun Lee, Rock-Hyun Baek, Dae Hwan Kim, Changhyun Kim, Myounggon Kang, Yoon Kim*
IEEE Access, 2024

14

Improved Resistive Switching Characteristics and Synaptic Functions of InZnO/SiO2 Bilayer Device
Dongyeol Ju, Minsuk Koo*, Sungjun Kim*
Materials, 2023

15

Recent Development in Biocompatible Biosensors
Yongju Lee, Swarup Biswas, Minsuk Koo, Hyeok Kim*
Journal of Sensor Science and Technology, 2023

16

Synaptic Characteristics and Vector-Matrix Multiplication Operation in Highly Uniform and Cost-Effective Four-Layer Vertical RRAM Array
Jihyung Kim, Subaek Lee, Sungjoon Kim, Seyoung Yang, Jung-Kyu Lee, Tae-Hyeon Kim, Muhammad Ismail, Chandreswar Mahata, Yoon Kim, Woo Young Choi*, Sungjun Kim*
Advanced Functional Materials, 2023

17

Design of a 180 nm CMOS Neuron Circuit with Soft-Reset and Underflow Allowing for Loss-Less Hardware Spiking Neural Networks
Jaesung Kim, Jung Nam Kim, Yoon Kim, Sungmin Hwang*, Minsuk Koo*
Advanced Intelligent Systems, 2023

18

Design Strategies of 40 nm Split-Gate NOR Flash Memory Device for Low-Power Compute-in-Memory Applications
Chan-Gi Yook, Jung Nam Kim, Yoon Kim, Wonbo Shim
MDPI Micromachines, 2023

19

Short- and Long-term Memory Based on a Floating-Gate IGZO Synaptic Transistor
Dongyeon Kang, Wonjung Kim, Jun Tae Jang, Changwook Kim, Jung Nam Kim, SungJin Choi, Jong-Ho Bae, Dong Myong Kim, Yoon Kim*, Dae Hwan Kim*
IEEE Access, 2023

20

Fowler–Nordheim Stress-Induced Degradation of Buried-Channel-Array Transistors in DRAM Cell for Cryogenic Memory Applications
Sungju Choi∇, Ga Won Yang∇, Sangwon Lee, Jingyu Park, Changwook Kim, Jun Park, Hyun-Seok Choi, Namhyun Lee, Gang-Jun Kim, Yoon Kim, Myounggon Kang, Changhyun Kim, Jong-Ho Bae*, Dae Hwan Kim*
IEEE Transactions on Electron Devices, 2022