,

Effect of Plasma Etch Damage on the Properties of 3C-SiC/Si Schottky Diodes

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내장형 캐패시터 응용을 위한 고밀도 BaTiO3/Cu 복합체 필름 제작 및 평가

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Device Technologies in SiC

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Temperature Distribution and Switching Characteristics of 1700V4H-SiC MOSFETs

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DLTS analysis of defect in N-type 4H-SiC