발행물
컨퍼런스
2018 한국전기전자재료학회 추계학술대회(KIEEME)
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Electrical Characterization of Al2O3/3C-SiC/Si diode
DLTS study of defects in n-,p-type 4H-SiC
HfO2/4H-SiC MOS 구조 전기적 특성 분석
Temperature Distribution and Switching Characteristics of 4H-SiC Trench SiC MOSFETs
Characterization of HfO2/AlN High-k Gate Dielectric Stack on 4H-SiC