발행물
컨퍼런스
2018 ENGE
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Characterization of HfO2/Al2O3/4H-SiC MOS structure
Structural and electrical properties of copper oxide/n-type silicon carbide heterostructures
Doping Dependent Electro-Thermal Analysis of 4H-SiC Trench MOSFETs
Cu metal coatings at room temperature via aerosol deposition process
2019 한국전기전자학회 학술대회
Characterization and Optimization of 4H-SiC Trench Gate MOSFETs