발행물
컨퍼런스
Non-Uniform UV Curing Effects on Mechanical and Fracture Properties of Organosilicate Low-k Thin Films
2007
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Optimizing Solution Chemistry for Reduced Damage during CMP
Solution Chemistry Effects on Cracking and Damage during CMP
Stress and Slurry Chemistry Effects on Cracking and Damage Evolution during CMP: Implications for Next Technology Nodes
13th International Conference on Chemical-Mechanical Polish Planarization (CMP) for ULSI Multilevel Interconnection (CMP-MIC)
2008
Optimizing CMP of Ultra-Low-k Dielectrics