,

The simulation of the pMOSFET degradation under NBTI using Si-SiO2 interface trap generation model based on Quantum mechanical simulation

,

3D Statistical Simulation Study of Mobility Fluctuation on MOSFET Induced by a Single Charge in SiO2 layer

,

Modeling of Negative Bias Temperature Instability: Quantum Mechanical Effect and Particle Simulation

,

A Unified Approach for the Realiability Modeling of MOSFETs

,

3D simulation study of local mobility fluctuation on MOSFET induced by a single trapped charge in SiO2 layer