,

Oxide for Nano-Scale MOSFETs, Using Multi-Frequency and -Temperature Charge Pumping Technique: Not vs. Oxide Processing

,

Stress-Free AC Measurement Method for Programming current and Gate current extraction with the Negative Substrate Bias in Stacked gate NOR Flash EEPOM

,

Reliability Studies on Non Planar DRAM Cell Transistor

,

Universal Reliability Modeling Strategy based on CLESICO

,

Characterization of Near-Interface Oxide Trap Density in Remote Plasma Nitrided Oxides for Nano-Scale MOSFETs