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141
Comparison for Performance and Reliability Between Nanowire FET and FinFET versus Technology Node
Hyunsuk Kim, Youngsoo Seo, Il Ho Myong, Min‐Soo Kim, Myounggon Kang, Hyungcheol Shin
Journal of Nanoscience and Nanotechnology, 2017
142
Analysis of Current-Boosting Using Trenched Source/Drain in Single and Stacked Nanowire FET
Youngsoo Seo, Hyunsuk Kim, Myounggon Kang, Hyungcheol Shin
Journal of Nanoscience and Nanotechnology, 2017
143
Line Edge Roughness and Process Variation Effect of Three Stacked Gate-All-Around Silicon MOSFET Devices
Dokyun Son, Kyul Ko, Changbeom Woo, Myounggon Kang, Hyungcheol Shin
Journal of Nanoscience and Nanotechnology, 2017
144
Characteristics According to Parameters of Line Edge Roughness in Ultra-Scaled Gate-All-Around Nanowire FET
Dokyun Son, Kyul Ko, Changbeom Woo, Myounggon Kang, Hyungcheol Shin
Journal of Nanoscience and Nanotechnology, 2017
145
Investigation and analysis of dual-k spacer with different materials and spacer lengths for nanowire-FET performance
Hyungwoo Ko, Jongsu Kim, Myounggon Kang, Hyungcheol Shin
Solid-State Electronics, 2017
146
Analysis and optimization of RC delay in vertical nanoplate FET
Changbeom Woo, Kyul Ko, Jongsu Kim, Min‐Soo Kim, Myounggon Kang, Hyungcheol Shin
Solid-State Electronics, 2017
147
Natural Local Self-Boosting Effect in 3D NAND Flash Memory
Myounggon Kang, Yoon Kim
IEEE Electron Device Letters, 2017
148
NOISE FIGURE IMPROVEMENT BY CONTROLLING WIRING EFFECTS IN RF LOW NOISE A MPLIFIERS
강명곤
MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, 2017
149
Analysis on DC and AC Characteristics of Self Heating Effect in Nanowire
Hyunsuk Kim, Youngsoo Seo, Il Ho Myong, Myounggon Kang, Hyungcheol Shin
Journal of Nanoscience and Nanotechnology, 2017
150
Various Extraction Methods for Parasitic Capacitances in Nanowire FET
Jongsu Kim, Hyungwoo Ko, Hyunbae Jeon, Myounggon Kang, Hyungcheol Shin
Journal of Nanoscience and Nanotechnology, 2017
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