발행물

전체 논문

233

141

Comparison for Performance and Reliability Between Nanowire FET and FinFET versus Technology Node
Hyunsuk Kim, Youngsoo Seo, Il Ho Myong, Min‐Soo Kim, Myounggon Kang, Hyungcheol Shin
Journal of Nanoscience and Nanotechnology, 2017

142

Analysis of Current-Boosting Using Trenched Source/Drain in Single and Stacked Nanowire FET
Youngsoo Seo, Hyunsuk Kim, Myounggon Kang, Hyungcheol Shin
Journal of Nanoscience and Nanotechnology, 2017

143

Line Edge Roughness and Process Variation Effect of Three Stacked Gate-All-Around Silicon MOSFET Devices
Dokyun Son, Kyul Ko, Changbeom Woo, Myounggon Kang, Hyungcheol Shin
Journal of Nanoscience and Nanotechnology, 2017

144

Characteristics According to Parameters of Line Edge Roughness in Ultra-Scaled Gate-All-Around Nanowire FET
Dokyun Son, Kyul Ko, Changbeom Woo, Myounggon Kang, Hyungcheol Shin
Journal of Nanoscience and Nanotechnology, 2017

145

Investigation and analysis of dual-k spacer with different materials and spacer lengths for nanowire-FET performance
Hyungwoo Ko, Jongsu Kim, Myounggon Kang, Hyungcheol Shin
Solid-State Electronics, 2017

146

Analysis and optimization of RC delay in vertical nanoplate FET
Changbeom Woo, Kyul Ko, Jongsu Kim, Min‐Soo Kim, Myounggon Kang, Hyungcheol Shin
Solid-State Electronics, 2017

147

Natural Local Self-Boosting Effect in 3D NAND Flash Memory
Myounggon Kang, Yoon Kim
IEEE Electron Device Letters, 2017

148

NOISE FIGURE IMPROVEMENT BY CONTROLLING WIRING EFFECTS IN RF LOW NOISE A MPLIFIERS
강명곤
MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, 2017

149

Analysis on DC and AC Characteristics of Self Heating Effect in Nanowire
Hyunsuk Kim, Youngsoo Seo, Il Ho Myong, Myounggon Kang, Hyungcheol Shin
Journal of Nanoscience and Nanotechnology, 2017

150

Various Extraction Methods for Parasitic Capacitances in Nanowire FET
Jongsu Kim, Hyungwoo Ko, Hyunbae Jeon, Myounggon Kang, Hyungcheol Shin
Journal of Nanoscience and Nanotechnology, 2017