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171
In-depth analysis of self-heating effects in vertical nanoplate-shaped GAAFETs
Dokyun Son, Ilho Myeong, Hyunsuk Kim, Myounggon Kang, Hyungcheol Shin
2017
172
Analysis of two divided component of NBTI framework using TCAD simulation
Shin-Keun Kim, Youngsoo Seo, Dokyun Son, Myounggon Kang, Hyungcheol Shin
2017
173
Analysis on self heating effects in nanowire ΓΕΤ considering effective thermal conductivity of BEOL
Hyunsuk Kim, Dokyun Son, Ilho Myoung, Myounggon Kang, Hyungcheol Shin
2017
174
Analysis on Self-Heating Effect in 7 nm Node Bulk FinFET Device
Sungwon Yoo, Hyunsuk Kim, Myounggon Kang, Hyungcheol Shin
JSTS Journal of Semiconductor Technology and Science, 2016
175
3D TCAD Analysis of Hot-Carrier Degradation Mechanisms in 10 nm Node Input/Output Bulk FinFETs
Dokyun Son, Sangbin Jeon, Myounggon Kang, Hyungcheol Shin
JSTS Journal of Semiconductor Technology and Science, 2016
176
Circuit Level Layout Optimization of MOS Transistor for RF and Noise Performance Improvements
Jongwook Jeon, Myounggon Kang
IEEE Transactions on Electron Devices, 2016
177
Down-Coupling Phenomenon of Floating Channel in 3D NAND Flash Memory
Yoon Kim, Myounggon Kang
IEEE Electron Device Letters, 2016
178
Studying the Variation Effects of Radiation Hardened Quatro SRAM Bit-Cell
T. Dang, Myounggon Kang, Jinsang Kim, Ik‐Joon Chang
IEEE Transactions on Nuclear Science, 2016
179
The study of relation between variable retention time and channel implantation
Younghwan Son, Myounggon Kang
Microelectronic Engineering, 2016
180
Accurate Estimation Technique of Low Frequency Noise in NAND Flash Cell Array
Jongwook Jeon, Ik‐Joon Chang, Myounggon Kang
IEEE Electron Device Letters, 2016
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