발행물
컨퍼런스
213th ECS meeting
2008
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The Study of Workfunction Measurement Method for Bilayer Metal Gate Electrode Using XPS
213TH ECS MEETING
COMPARISON OF GROWTH RATE AT OXIDATION OF SI/SI1-XGEX NANOWIRES
A STUDY ON THE FORMATION PROCESSES AND MICROSTRUCTURES OF NI-SILISIDE FILMS ON EPI-SI1-XCX
2008 MRS SPRING MEETING
THE STUDY OF HAFNIUM SILICATE BY VARIOUS NITROGEN GAS ANNEALING TREATMENT
Materials Research Society 2008 Spring Meeting
Crystalline behavior and mircostructure of Laser Induced Ge2Sb2Te5 and N-doped Ge2Sb2Te5 Thin Films