발행물
컨퍼런스
American Vacuum Society 57th International Symposium & Exhibition
2010
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Bipolar Switching Behaviors in TiN/HfO2/Pt Systems for Nonvolatile Resistive Memory Applications
218th ECS meeting
Investigation of Process Parameters on the Properties of Selective Epitaxial Growth SiGe Structure
ICPS 2010
The thermal stability and electronic structure in atomic-layerdeposited Hf-Al-O film on n-GaAs (100)
ALD 2010 (AVS)
The investigation on electronic structures of atomic-layer-deposited HfO2 film on n-GaAs (100)
217th ECS Meeting
Investigation of the Interface Oxide of Al2O3/HfO2 and HfO2/Al2O3 Stacks on GaAs(100) Surfaces