Effect of Acceptor Doping on Phase Transitions of HfO2 Thin Films for Energy-Related Applications
Min Hyuk Park*, Tony Schenk, Michael Hoffmann, Steve Knebel, Jan Gärtner, Thomas Mikolajick, Uwe Schroeder
Nano Energy, 2017.06
132
A Comprehensive Study on the Structural Evolution of HfO2 Thin Films Doped with Various Dopants
Min Hyuk Park*, Tony Schenk, Chris M. Fancher, Everett D. Grimley, Chuanzhen Zhou, Claudia Richter, James M. LeBeau, Jacob L. Jones, Thomas Mikolajick, Uwe Schroeder
J. Mater. Chem. C, 2017.05
133
Domain Pinning: Comparison of Hafnia and PZT Based Ferroelectrics
Franz P. G. Fengler, Milan Pešić, Sergej Starschich, Theodor Schneller, Christopher Künneth, Ulrich Böttger, Halid Mulaosmanovic, Tony Schenk, Min Hyuk Park, Robin Nigon, Paul Muralt, Thomas Mikolajick, Uwe Schroeder*
Adv. Electron. Mater., 2017.04
134
Research Update: Diode performance of the Pt/Al2O3/two-dimensional electron gas/SrTiO3 structure and its time-dependent resistance evolution
Taehwan Moon, Hae Jun Jung, Yu Jin Kim, Min Hyuk Park, Han Joon Kim, Keum Do Kim, Young Hwan Lee, Seung Dam Hyun, Hyeon Woo Park, Sang Woon Lee, Cheol Seong Hwang*
APL Mater., 2017.04
135
Two-step polarization switching mediated by nonpolar intermediate phase in Hf0.4Zr0.6O2 thin film
Min Hyuk Park, Han Joon Kim, Young Hwan Lee, Yu Jin Kim, Taehwan Moon, Keum Do Kim, Seung Dam Hyun, Cheol Seong Hwang*
Nanoscale, 2016.10
136
Ferroelectricity in undoped-HfO2 thin films induced by deposition temperature control during atomic layer deposition
Keum Do Kim, Min Hyuk Park, Han Joon Kim, Yu Jin Kim, Taehwan Moon, Young Hwan Lee, Seung Dam Hyun, Taehong Gwon, Cheol Seong Hwang*
J. Mater. Chem. C, 2016.07
137
Time-Dependent Negative Capacitance Effects in Al2O3/BaTiO3 Bilayers
Yu Jin Kim, Hiroyuki Yamada, Taehwan Moon, Young Jae Kwon, Cheol Hyun An, Han Joon Kim, Keum Do Kim, Young Hwan Lee, Seung Dam Hyun, Min Hyuk Park, Cheol Seong Hwang*
Nano Lett., 2016.07
138
Effect of Zr Content on the Wake-Up Effect in Hf1−xZrxO2 Films
Min Hyuk Park, Han Joon Kim, Yu Jin Kim, Young Hwan Lee, Taehwan Moon, Keum Do Kim, Seung Dam Hyun, Franz Fengler, Uwe Schroeder, Cheol Seong Hwang*
ACS Appl. Mater. Interfaces, 2016.06
139
Alternative interpretations for decreasing voltage with increasing charge in ferroelectric capacitors
Seul Ji Song, Yu Jin Kim, Min Hyuk Park, Young Hwan Lee, Han Joon Kim, Taehwan Moon, Keum Do Kim, Jung-Hae Choi, Zhihui Chen, Anquan Jiang, Cheol Seong Hwang*
Sci. Rep., 2016.02
140
A study on the wake-up effect of ferroelectric Hf0.5Zr0.5O2 films by pulse-switching measurement
Han Joon Kim, Min Hyuk Park, Yu Jin Kim, Young Hwan Lee, Taehwan Moon, Keum Do Kim, Seung Dam Hyun, Cheol Seong Hwang*