발행물

전체 논문

354

131

Probabilistic artificial neural network for line-edge-roughness-induced random variation in FinFET
Lim, J., Lee, J., Shin, C.
IEEE Access, 2021

132

Gate-Stack Engineering to Improve the Performance of 28 nm Low-Power High-K/Metal-Gate Device
Park, J., Jang, W., Shin, C.
Micromachines, 2021

133

Program/Erase Scheme for Suppressing Interface Trap Generation in HfO 2-Based Ferroelectric Field Effect Transistor
Min, J., Ronchi, N., McMitchell, S. R., O’Sullivan, B., Banerjee, K., Van Houdt, J., Shin, C.
IEEE Electron Device Letters, 2021

134

Impact of Process-Induced Variations on Negative Capacitance Junctionless Nanowire FET
Choi, Y., Lee, J., Lim, J., Moon, S., Shin, C.
Electronics, 2021

135

Abruptly-Switching MoS₂-Channel Atomic-Threshold-Switching Field-Effect Transistor With AgTi/HfO₂-Based Threshold Switching Device
Jeong, S., Han, S., Lee, H. J., Eom, D., Youm, G., Choi, Y., ..., Shin, C.
IEEE Access, 2021

136

A soft pressure sensor array based on a conducting nanomembrane
Jung, D., Kang, K., Jung, H., Seong, D., An, S., Yoon, J., ..., Son, D.
Micromachines, 2021

137

Design of JL-CFET (junctionless complementary field effect transistor)-based inverter for low power applications
Lee, S., Choi, Y., Won, S. M., Son, D., Baac, H. W., Shin, C.
Semiconductor Science and Technology, 2022

138

Inverter design with positive feedback field-effect transistors
Lee, C., Han, C., Shin, C.
Semiconductor Science and Technology, 2022

139

Quantitative Evaluation of Line-Edge Roughness in Various FinFET Structures: Bayesian Neural Network With Automatic Model Selection
Yu, S., Won, S. M., Baac, H. W., Son, D., Shin, C.
IEEE Access, 2022

140

Strain-Dependent Photoacoustic Characteristics of Free-Standing Carbon-Nanocomposite Transmitters
Faraz, M., Abbasi, M. A., Son, D., Shin, C., Lee, K. T., Won, S. M., Baac, H. W.
Sensors, 2022