Analysis of Wake-Up Reversal Behavior Induced by Imprint in La:HZO MFM Capacitors

Experimental study of endurance characteristics of Al-doped HfO2 ferroelectric capacitor

Design for Variability: Counter-Doped Source/Drain Epitaxy Pockets in Gate-All-Around FET

GAN-Based Framework for Unified Estimation of Process-Induced Random Variation in FinFET

Impact of Various Pulse-Bases on Charge Boost in Ferroelectric Capacitors

Understanding of carriers' kinetic energy in steep-slope P plus N plus P plus N plus feedback field effect transistor

Improved remnant polarization of Zr-doped HfO2 ferroelectric film by CF4/O2 plasma passivation

Simulation Study: The Impact of Structural Variations on the Characteristics of a Buried-Channel-Array Transistor (BCAT) in DRAM

Vertical Gate-All-Around Device Architecture to Improve the Device Performance for Sub-5-nm Technology

Epidermal piezoresistive structure with deep learning-assisted data translation