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61
Photofield effect and photoresponse properties of the transparent oxide-based BaInZnO thin-film transistors
S. J. Kim, B. Gunduz, D. H.Yoon, H. J. Kim, A. A. Al-Ghamdi, F. Yakuphanoglu
Sensors and Actuators A: Physical, 2013
62
The effect of various solvents on the back channel of solution-processed In-Ga-Zn-O thin-film transistors intended for biosensor applications
S. J. Kim, J. Jung, D. H. Yoon, H. J. Kim
Journal of Physics D: Applied Physics, 2013
63
Electrical responses of artificial DNA nanostructures on solution-processed In-Ga-Zn-O thin-film transistors with multistacked active layers
J. Jung, S. J. Kim, D. H. Yoon, B. Kim, S. H. Park, H. J. Kim
ACS Applied Materials & Interfaces, 2013
64
Hole transport enhancing effects of polar solvents on Poly(3,4-ethylenedioxythiophene):Poly(styrene sulfonic acid) for organic solar cells
J. S. Yang, S. H. Oh, D. L. Kim, S. J. Kim, H. J. Kim
ACS Applied Materials & Interfaces, 2012
65
Low-voltage driving solution-processed nickel oxide based unipolar resistive switching memory with Ni nanoparticles
D. H. Yoon, S. J. Kim, J. Jung, H. S. Lim, H. J. Kim
Journal of Materials Chemistry, 2012
66
Artificial DNA nanostructure detection using solution-processed In-Ga-Zn-O thin-film transistors
S. J. Kim, B. Kim, J. Jung, D. H. Yoon, J. Lee, S. H. Park, H. J. Kim
Applied Physics Letters, 2012
67
Direct current (DC) bias stress characteristics of a bottom-gate thin-film transistor with an amorphous/microcrystalline Si double layer
T. H. Jeong, S. J. Kim, H. J. Kim
Transactions on Electrical and Electronic Materials, 2011
68
Low-temperature solution-processed ZrO2 gate insulators for thin-film transistors using high-pressure annealing
S. J. Kim, D. H. Yoon, Y. S. Rim, H. J. Kim
Electrochemical and Solid-State Letters, 2011
69
Solution-processed oxide thin-film transistors using aluminum and nitrate precursors for low-temperature annealing
W. H. Jeong, J. H. Bae, K. M. Kim, D. L. Kim, Y. S. Rim, S. J. Kim, K.-B. Park, J.-B. Seon, M.-K. Ryu, H. J. Kim
Journal of the Society for Information Display, 2011
70
Stability of solution-processed ZrInZnO thin-film transistors under gate bias stress
T. H. Jeong, S. J. Kim, D. H. Yoon, W. H. Jeong, D. L. Kim, H. S. Lim, H. J. Kim
Journal of the Korean Physical Society, 2011
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