발행물
컨퍼런스
하계 종합 학술발표회 논문집
2010.06
,
Research of Memory Characteristics of GAA(Gate All Around) and DG(Double Gate) Type Bit Line Stacked Array,
Study of 3-dimentional stacked vertical NAND falsh memory,
Vertical Crosstalk Phenomenon (VCP) Among Neighboring Cells in 3D Stacked NAND Flash Memory,
Device Research Conference
Highly Scalable Vertical Bandgap-Engineered NAND Flash Memory,
Investigation of Current Degradation Induced by Silicide Source/Drain in the nanowire NAND Flash Memory