발행물
컨퍼런스
하계 종합 학술발표회 논문집
2010.06
,
Investigation of Width Dependent Retention Characteristics with GAA(Gate-All-Around) SONOS structure
Research of Memory Characteristics of GAA(Gate All Around) and DG(Double Gate) Type Bit Line Stacked Array
Study of 3-dimentional stacked vertical NAND falsh memory
Vertical Crosstalk Phenomenon (VCP) Among Neighboring Cells in 3D Stacked NAND Flash Memory
Device Research Conference
Highly Scalable Vertical Bandgap-Engineered NAND Flash Memory